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Specimen Preparation for X-ray Fluorescence Workshop - 2007, 2008, 2009, 2010

Rietveld Refinement & Indexing Workshop - 2007, 2008, 2009, 2010






Course Description:
The course is intended for beginners as well as advanced users of powder diffraction methods in materials, geo, physical, chemical and pharmaceutical sciences. There are no special requirements for this course but participants should be familiar with the principles of X-ray diffraction and crystallography. The course will provide an overview of state of the art methods for structure determination and refinement from powder data. After the lectures, all participants will have the opportunity to practice on PC’s. Examples at different levels of complexity will be provided. Your are also welcome to bring your own datasets.

The lectures and exercises include:

Data reduction (including data from high pressure, high/low temperature experiments)
Peak fitting and intensity extraction (LeBail- and Pawley methods)
Traditional structure determination methods for powders (Direct methods, Patterson search method)
Methods for structure determination in real space (Monte-Carlo and simulated annealing)
Combination of structure refinement and energy minimization
The Rietveld method (including the use of soft constraints and rigid bodies)
Fourier analysis versus maximum entropy

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